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  • Low-energy ion scattering - Wikipedia
    LEIS involves directing a stream of charged particles known as ions at a surface and making observations of the positions, velocities, and energies of the ions that have interacted with the surface
  • 低能粒子散射谱_百度百科
    低能离子散射谱（Low-Energy Ion Scattering，LEIS）是一种表面分析技术。 该技术采用能量为1,000-8,000 eV的惰性气体离子束轰击样品表层，通过弹性碰撞产生的散射离子能谱分析最表层（通常小于3个原子层）的原子成分及结构，适用于催化材料、半导体及绝缘材料表面
  • Low energy ion scattering (LEIS). A practical introduction to its . . .
    Low energy ion scattering (LEIS) probes the elemental composition of the outermost atomic layer of a material and provides static depth profiles of the outer ca 10 nm of surfaces
  • Low-energy ion scattering (LEIS) - ScienceDirect
    The LEIS intensity is plotted in units of counts nC, that is, the measurement signal normalized to the number of primary ions used With this normalization, different spectra can be easily compared, even if they are recorded with different primary ion currents and or total acquisition times
  • Low energy ion scattering (LEIS) - Institute for Functional Materials . . .
    Low energy ion scattering (LEIS) Considered the most surface sensitive elemental analysis technique in existence, LEIS uses a low energy beam of He or Ne ions to probe the top atomic layer of a sample
  • Low Energy Ion Scattering (LEIS) Spectroscopy | SpringerLink
    This overview chapter introduces the LEIS technique and highlights the significant advantages offered by the newer HS-LEIS spectroscopy Examples will be selected from one component bulk oxides, bulk mixed oxides, supported metal oxides, supported metals, and supported bimetallic catalytic materials
  • lt;br gt;解释低能离子散射 (LEIS) 光谱的实用指南,Applied Surface Science - X-MOL
    低能离子散射 (LEIS) 光谱测定法对于材料的最外层原子层非常敏感且具有特异性。 它是表面科学的强大工具。 在这里，我们提出了基于各种材料的实际 LEIS 光谱的 LEIS 光谱解释实用指南。 虽然本文涵盖了 LEIS 的一些理论，但它并未对该技术的这方面进行详尽的
  • 低能离子散射谱法_百度百科
    低能离子散射谱法（low energy ion scattering spectroscopy，LEIS）的中文名、外文名及学科归属信息2016年收录于《化学名词》第二版。
  • A practical guide to interpreting low energy ion scattering (LEIS . . .
    It is a powerful tool for surface science Here, we present a practical guide on LEIS spectral interpretation that is based on actual LEIS spectra of a variety of materials While this article covers some of the theory of LEIS, it is not an exhaustive description of this aspect of the technique
  • LEIS – Knowledge and References – Taylor Francis
    LEIS is used to determine the atomic composition of surfaces, but is sensitive only to the outermost atomic layer of the solid It is commonly used in various characterization techniques, such as probing the first few atomic layers of nanostructured materials





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